New detectors with increased sensitivity for quality control of industrial products have been developed at Tomsk State University (TSU). This was reported by the press service of the Ministry of Education and Science of the Russian Federation.
The created detectors are capable of detecting even the smallest defects that cannot be detected by other methods.
The development has proven its effectiveness. Detectors can be customized for different materials by selecting modes.
The functional feature of the new detectors is the ability to register single particles and quanta in each elementary cell of the matrix detector and distinguish materials by atomic number. The new detectors have high radiation resistance, so they can be used in various fields.
The basis of the new detectors is multi-element sensors made of gallium arsenide compensated with chromium (HR GaAs:Cr).
Image processing algorithms play a special role in the operation of detectors. Scientists have created a package of computer programs for which four patents have been obtained.
Such detectors have been developed in Russia for the first time.
Earlier, www1.ru reported that high-sensitivity detectors for space research were developed at MISIS.
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