Три программы для проверки сенсоров в микроэлектронике запатентовали в ТГУ

Developments improve signal filtering, amplitude spectrum analysis, and electrophysical characteristics of materials

Tomsk State University (TSU) has patented three software solutions for testing and processing sensor signals developed at the Center for Advanced Technologies in Microelectronics (PTM). The programs improve the quality and reliability of reading devices used in medicine, industry, and scientific research.

The first program is designed for digital filtering of pulsed signals. It helps to isolate the useful signal from noise, which is critical for accurate measurements and high-speed radiation registration. This is especially important in small-channel systems, where intense particle fluxes can make it difficult to identify individual sensor sectors, explained Anton Tyazhev, a researcher at PTM TSU.

The second development allows constructing the amplitude spectrum of X-ray sensor signals in real time. The program evaluates the charge collection efficiency of the sensor — an analogue of the efficiency coefficient, showing what part of the energy the sensor converts into a useful signal. The higher this indicator, the more accurate and high-quality the device's operation.

The third program extracts the electrophysical characteristics of the sensor material, in particular, the product of mobility and lifetime of charge carriers — a key parameter for assessing the quality of the detector material. This allows for a deeper study of internal processes and optimization of sensor characteristics for specific operating conditions.

All programs can be installed on a digital oscilloscope running Windows, processing data in real time without additional equipment. The system analyzes signals directly from the sensor after digitization, which allows tracking the intensity of radiation and spectral composition even at high-speed particle fluxes.

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TASS

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