Rostec engineers presented a manual probe station for checking the functionality of microchips directly on a silicon wafer. The equipment, branded OmegaAir-150COAX, is designed for measuring and controlling the electrical parameters of semiconductors in laboratory conditions, including in rooms with moderate and cold macroclimates.
The device measures key electrical values of semiconductor wafers and helps to reject defective chips before the packaging stage. The solution accelerates the debugging of technological processes and reduces the cost of microelectronics production.
The station accepts wafers up to 150 millimeters in diameter and supports the installation of up to four micropositioners – mechanisms for precise positioning of measuring probes to contact pads. The operator quickly positions the tool with minimal effort thanks to thoughtful ergonomics and three fixed positions of the work table: loading, alignment, contact with the sample. Galvanic isolation of the table eliminates parasitic interference during sensitive measurements, and compact dimensions (600×480×480 mm) allow the equipment to be placed even in a small laboratory.
OmegaAir-150COAX is already ready for operation in measurement centers and research laboratories. The equipment meets the need for an accessible input control tool and supports the development cycle of domestic microcircuits.
Read more on the topic:
- Breakthrough in Microchip Cooling: Russian Scientists Propose New Solution
- Russia is creating a replacement for American CAD for microchips: this could be a breakthrough in import substitution of microelectronics
- New Russian chip based on RISC-V architecture: Baikal Electronics to release one million Baikal-U microcontrollers in 2026
