A unique X-ray microscope for the Siberian Ring Photon Source (SKIF) — X-ray eye — has been developed at Tomsk Polytechnic University (TPU). This was reported by the university's press service.
According to Alexey Gogolev, Vice-Rector for Science and Strategic Projects at TPU, measuring the parameters of the synchrotron radiation beam is a key task at synchrotron stations. This data is necessary to assess the efficiency of optical elements and the optical path. However, direct measurements of beams smaller than five micrometers pose significant difficulties.
The main function of the X-ray eye microscope is to register the synchrotron radiation beam itself: by the image that the beam leaves on the screen, scientists will be able to determine its parameters (size, divergence, displacement relative to a given axis, etc.) and, thanks to them, adjust all beam control systems in such a way as to obtain it at the location of the sample under study.
The X-ray microscope is equipped with the function of changing the field of view and quickly changing single-crystal scintillation screens. This allows for research with both high spatial resolution and high sensitivity.
The microscope is controlled using software. It provides research in a wide range of resolutions — from nano to meso, and also allows processing large amounts of data and conducting statistical analysis of samples. The scanning speed using this software is more than 300 times higher than similar programs.
The development can also be used to study samples using nanoradiography and nanotomography methods with a basic spatial resolution of up to 270 nanometers.
Earlier, www1.ru reported that in Tomsk, the SKIF Cyberia supercomputer was modernized for projects on the Russian NICA collider.
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