Researchers at Ogarev Mordovian State University (MSU) have developed a method for controlling pores in thin metal coatings of engineering products. Thanks to it, technological processes for product manufacturing can be corrected, the university's press service reported.
Metal films and coatings are used in microelectronics, radio engineering, optics, laser technology, energy, and mechanical engineering. The operational characteristics of products depend on the distribution of pores within these films and coatings. Scientists conventionally divide pores into 2 types: open (interconnected) and closed (isolated within the material).
Mordovian specialists proposed a new method to determine the total (integral) porosity (sum of open and closed voids) on a metal layer 1 to 50 µm thick. For this, the developers place a foil with a round hole on the studied layer and illuminate it with an optical profilometer.
By calculating the difference between the obtained profile heights of the metal layer surface inside the hole and the substrate surface profile, the geometric thickness of the thin metal layer in a local area can be determined.
Then, using an X-ray fluorescence thickness gauge, the effective X-ray thickness of the metal layer is measured. Knowing the difference between the geometric thickness and the X-ray thickness, scientists find the integral porosity, Novopoltsev added.
Unlike existing methods for determining total porosity, the method developed by Ogarev MSU specialists is simple and effective. Most enterprises have an optical profilometer and an X-ray fluorescence thickness gauge. Therefore, no additional equipment is required for its implementation, the university concluded.